Ametek SolarLab XM Photoelectrochemical Test System
Specific XM instrument designed for research of solar cells and photovoltaics
Price depends on configuration
Available in several configurations and accessory sets. The quote includes price, lead time and a configuration recommended for your application.
- Authorized importer and distributor, manufacturer warranty
- Technical advice before and after purchase
- New unit in the manufacturer’s original packaging
SolarLab XM is a new application-specific product that is primarily focused on solar cell and photovoltaic research. The system offers a high-quality measurement platform for characterizing a range of photoelectrochemical devices such as DSSC's, Perovskite cells, and Photoanodes," noted Professor Laurie Peter, world leading expert, University of Bath, UK. Professor Peter acted as scientific advisor during the development of the ModuLab PhotoEchem system and helped ensure that it met the requirements of today's most demanding photovoltaic researchers. SolarLab XM includes a potentiostat, frequency response analyzer (FRA) and PhotoEchem module that provide complete characterization of a wide range of Solar cells and PV cells, including Perovskite and Dye Sensitized Solar Cells (DSSC). Additionally, the system can be used for development of visible spectrum photoelectrochemical systems such as Iron-Oxide photo-splitting of water.
Highlights
- Developed in conjunction with Professor Laurie Peter
- Frequency and time domain techniques including IMPS, IMVS, Impedance, Photovoltage Decay, Charge Extraction, I-V
- Auto analysis for calculating effective diffusion coefficients and electron lifetimes
- NIST traceable light source calibration
- Excellent thermal management of light sources for long term stability
- Full set of electrochemical techniques (cyclic voltammetry, chrono methods, galvano methods, impedance and AC voltammetry)
- IPCE option for quantum efficiency measurements
- SolarLab XM's impedance accuracy contour plot highlights Solartron's best in class measurement performance.
| Specifications | ModuLab XM PhotoEchem | SolarLab XM |
| Wavelength Range |
350 nm - 1100 nm |
|
|
Intensity Range |
6 Decades (with ND Filter) |
|
|
Maximum Beam Divergence |
4 degrees |
|
| Maximum Beam Diameter / Cell Size |
1 cm |
|
| IMPS / IMVS Transfer Function |
Reference Photodetector |
|
| Calibration |
NIST Traceable |
|
| LED Driver Maximum Current |
10 A |
|
| Typical LED Stability at Max Power |
< 2% Drift after 24 hours |
|
| LED Driver Maximum Frequency (IMPS and IMVS) |
250 kHz |
|
| Expandable to:aterials Testing Low-current Measurements (Femto Amp) | Yes | No |
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